The new M3 Version 4 is now available! Read below about the powerful new functionality that has been added to the M3 Measuring Software.
-64 Bit Support
The M3 v4.00.00 marks the move from a 32bit application to a 64bit application
- Access to additional available PC system memory(RAM).
- Faster management of large part programs.
- Support for larger stitched images.
- Faster processing of large DXF files.
- Current with the file systems of modern PC and Windows applications.
-Save/Load Reference Frame Files
- Save reference frames to, and load references frames from, an external file.
- Utilize ref frame files to support the use of part fixtures across multiple programs and multiple machines.
- Ref frame files update both coordinate system and registration information in the software.
-Expanded 3D Feature Support
- Distances constructed between 3D features will now default to 3D type. Distances between 2D/Projected features can be changed to a 3D distance type.
- 3D distances can be Perpendicular Center to Center, or Nearest Surface.
- 3D line information can now be generated via the new “Axis” feature type.
- The new “Axis” feature will contain Phi, XY/YZ/ZX coefficients for its 3D position and orientation.
-Enhanced Program Recording Mode
- Author part programs explicitly using the new Advanced Record Mode button.
- Feature measurement steps, will be displayed in the program list as they are recorded, including goto moves, light control steps, message steps, etc..
- Full access to program editing functions while recording part programs.
-Probe and Goto Path Editing
- New goto and probe path view in the M3 partview.
- Edit touch probe points and goto positions using the new editing dialog.
- Use single step mode to move through complex part programs one step at a time.
-Near/Far VED Probe
- A new Near/Far video probe can be added to the V4 probe menu.
- The “buffer style” probe creates a rectangular region where the nearest and furthest point within the region can be probed.
- Using the “skew lock” mode for the probe allows for locking the probes scan orientation to the current part alignment.
-Color/Contrast Image Process Controls
- Two new image processing functions have been added to the V4.
- A color filter allows for the separation of equally bright, but different color regions of a part.
- A contrast/binarize filter has been added to allow for the increase or decrease of contrast in an image.
- Images under IP control will be converted to greyscale.
-Profile Fit from Alternate Point Sources
Three new profile enhancements have been introduced in V4.
- 1) Probed features in the M3 can now be used as point sources for a profile fit.
- 2) Previously fit profiles can now be “combined/refit” into a new single profile fit result.
- 3) Profile fitting is now supported in optical comparator systems.
